Reliability and Availability Prediction

RAM Commander software provides everything necessary for Reliability and Availability Prediction and analysis of electronic equipment, mechanical and electro-mechanical equipment. Graphical presentation of the projects Product Tree (bill of materials, or system breakdown) allows visibility and easy data manipulation:
Product Tree Table

Product Tree Table

Primary reliability prediction (MTBF / failure rate calculation) is based on one of the prediction methods (like MIL-HDBK-217, FIDES, Telcordia, NSWC or 217Plus) – read more about primary reliability prediction.
Different additional Reliability and Availability Prediction analysis tools are available and described below.
Performing reliability allocation, Pareto analysis, RAM sensitivity analysis producing temperature curves and mission profile are extremely easy with RAM Commander.RAM Commander produces all commonly required reliability reports and allows the user to define customized reports.

Pareto analysis identifies components or component families that contribute most significantly to system or assembly failure rate – about 80% of total failure rate.

Failure Rate Vs Temperature

Presents the failure rate or MTBF as a function of temperature: regular, multi-environment & multi-items on one graph.

Field Failure Rate Module

Provides a great solution when Field/Manufacturer’s Failure Rates are known only for a few temperature values and there is a need to input FR values with reference to environment and temperature and extrapolate FR for different other environments and temperatures.

Mission Profile Analyzer calculates reliability according to Mission Profile defined as a sequence of Mission phases. Each mission phase has duration, environment and temparature, test performance and efficiency and may be defined as phase performing in operating or non-operating mode: